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Autor/inn/en | Snyder, Scott; Sheehan, Robert |
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Titel | Rasch Analysis of the Standardization Data of the Bayley Mental Scale of Infant Development. |
Quelle | In: Diagnostique, 17 (1992) 3, S.185-94 |
Sprache | englisch |
Dokumenttyp | gedruckt; Zeitschriftenaufsatz |
ISSN | 0737-2477 |
Schlagwörter | Child Development; Cognitive Tests; Concurrent Validity; Construct Validity; Infants; Intelligence Tests; Item Analysis; Psychometrics; Standardized Tests; Test Reliability; Test Validity; Toddlers; Bayley Scales of Infant Development |
Abstract | Rasch calibration procedures were applied to item-response data for the 1,262 infants and toddlers comprising the standardization sample for the Mental Scale of the Bayley Scales of Infant Development. Analyses tend to confirm the psychometric integrity of the instrument. (Author) |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |