Controlling the Speededness of Assembled Test Forms: A Generalization to the Three-Parameter Lognormal Response Time Model

Autor/inn/en	Becker, Benjamin; Weirich, Sebastian; Goldhammer, Frank; Debeer, Dries
Titel	Controlling the Speededness of Assembled Test Forms: A Generalization to the Three-Parameter Lognormal Response Time Model
Quelle	In: Journal of Educational Measurement, 60 (2023) 4, S.551-574 (24 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Zusatzinformation	ORCID (Becker, Benjamin)
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0022-0655
DOI	10.1111/jedm.12364
Schlagwörter	Test Construction; Automation; Models; Test Items; Reaction Time + Suchen Sie Ihr Suchwort? Testaufbau; Analogiemodell; Test content; Testaufgabe; Reaktionsvermögen
Abstract	When designing or modifying a test, an important challenge is controlling its speededness. To achieve this, van der Linden (2011a, 2011b) proposed using a lognormal response time model, more specifically the two-parameter lognormal model, and automated test assembly (ATA) via mixed integer linear programming. However, this approach has a severe limitation, in that the two-parameter lognormal model lacks a slope parameter. This means that the model assumes that all items are equally speed sensitive. From a conceptual perspective, this assumption seems very restrictive. Furthermore, various other empirical studies and new data analyses performed by us show that this assumption almost never holds in practice. To overcome this shortcoming, we bring together the already frequently used three-parameter lognormal model for response times, which contains a slope parameter, and the ATA approach for controlling speededness by van der Linden. Using multiple empirically based illustrations, the proposed extension is illustrated, including complete and documented R code. Both the original van der Linden approach and our newly proposed approach are available to practitioners in the freely available R package eatATA. (As Provided).
Anmerkungen	Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us
Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2024/1/01