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Autor/inn/enButcher, Madeleine; Cohen, Elizabeth L.; Kunkle, Christine E.; Totzkay, Daniel
TitelGeek Girl Today, Scientist Tomorrow? Inclusive Experiences and Efficacy Mediate the Link between Women's Engagement in Popular Geek Culture and STEM Career Interest
QuelleIn: International Journal of Science Education, Part B: Communication and Public Engagement, 13 (2023) 3, S.276-291 (16 Seiten)Infoseite zur Zeitschrift
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ZusatzinformationORCID (Cohen, Elizabeth L.)
ORCID (Kunkle, Christine E.)
ORCID (Totzkay, Daniel)
Spracheenglisch
Dokumenttypgedruckt; online; Zeitschriftenaufsatz
ISSN2154-8455
DOI10.1080/21548455.2023.2172624
SchlagwörterPersonality Traits; Inclusion; Student Experience; Learner Engagement; Females; Popular Culture; Vocational Interests; Gender Discrimination; Gender Bias; Undergraduate Students; Adults; Self Concept; Student Participation; Masculinity; Mediation Theory
AbstractEvidence suggests that participating in geek pop culture (e.g. fandoms, digital gaming, live action role playing, board gaming, etc.) can enhance women's interest in STEM by increasing their STEM-related efficacy. This study proposed that this effect hinges on the type of social experiences that women have in geek culture. Inclusive experiences were expected to enhance STEM-related efficacy, while experiences of hostile sexism in these spaces were expected to diminish STEM-related efficacy. An online survey of both U.S. MTurk users (N = 77) and undergraduate students (N = 172) under the age of 30 demonstrated that inclusive experiences and STEM-related efficacy does serially mediate the effect of geek culture engagement on interest in STEM careers. A second model examining the indirect effect of geek engagement on STEM career interest through hostile sexism and STEM-efficacy was not significant. These findings underscore the broader implications of creating a welcoming environment for women in geek culture. They also suggest that women who experience hostile sexism in geek culture and continue to participate might have a general tolerance of toxic geek masculinity. (As Provided).
AnmerkungenRoutledge. Available from: Taylor & Francis, Ltd. 530 Walnut Street Suite 850, Philadelphia, PA 19106. Tel: 800-354-1420; Tel: 215-625-8900; Fax: 215-207-0050; Web site: http://www.tandf.co.uk/journals
Erfasst vonERIC (Education Resources Information Center), Washington, DC
Update2024/1/01
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