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Autor/inn/en | Ma, Qiuli; Starns, Jeffrey J.; Kellen, David |
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Titel | Bias Effects in a Two-Stage Recognition Paradigm: A Challenge for "Pure" Threshold and Signal Detection Models |
Quelle | In: Journal of Experimental Psychology: Learning, Memory, and Cognition, 48 (2022) 10, S.1484-1506 (23 Seiten)
PDF als Volltext |
Zusatzinformation | ORCID (Starns, Jeffrey J.) |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0278-7393 |
DOI | 10.1037/xlm0001107 |
Schlagwörter | Recognition (Psychology); Memory; Decision Making; Error Correction; Stimuli; Bias; Models; College Students; Probability; Massachusetts |
Abstract | We explored a two-stage recognition memory paradigm in which people first make single-item "studied"/"not studied" decisions and then have a chance to correct their errors in forced-choice trials. Each forced-choice trial included one studied word ("target") and one nonstudied word ("lure") that received the same previous single-item response. For example, a studied-studied trial would have a target that was correctly called "studied" and a lure that was incorrectly called "studied." The two-high-threshold (2HT) model and the unequal-variance signal detection (UVSD) model predict opposite effects of biasing the initial single-item responses on subsequent forced-choice accuracy. Results from two experiments showed that the bias effect is actually near zero and well out of the range of effects predicted by either model. Follow-up analyses suggested that the model failures were not a function of experiment artifacts like changing memory states between the two types of recognition trials. Follow-up analyses also showed that the dual process signal detection model made better predictions for the forced-choice data than 2HT and UVSD models. (As Provided). |
Anmerkungen | American Psychological Association. Journals Department, 750 First Street NE, Washington, DC 20002. Tel: 800-374-2721; Tel: 202-336-5510; Fax: 202-336-5502; e-mail: order@apa.org; Web site: http://www.apa.org |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2024/1/01 |