Using Simulated Annealing to Investigate Sensitivity of SEM to External Model Misspecification

Autor/inn/en	Fisk, Charles L.; Harring, Jeffrey R.; Shen, Zuchao; Leite, Walter; Suen, King Yiu; Marcoulides, Katerina M.
Titel	Using Simulated Annealing to Investigate Sensitivity of SEM to External Model Misspecification
Quelle	In: Educational and Psychological Measurement, 83 (2023) 1, S.73-92 (20 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Zusatzinformation	ORCID (Harring, Jeffrey R.) ORCID (Leite, Walter) ORCID (Marcoulides, Katerina M.)
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0013-1644
DOI	10.1177/00131644211073121
Schlagwörter	Structural Equation Models; Algorithms; Simulation; Evaluation Methods + Suchen Sie Ihr Suchwort? Algorithm; Algorithmus; Simulation program; Simulationsprogramm
Abstract	Sensitivity analyses encompass a broad set of post-analytic techniques that are characterized as measuring the potential impact of any factor that has an effect on some output variables of a model. This research focuses on the utility of the simulated annealing algorithm to automatically identify path configurations and parameter values of omitted confounders in structural equation modeling (SEM). An empirical example based on a past published study is used to illustrate how strongly related an omitted variable must be to model variables for the conclusions of an analysis to change. The algorithm is outlined in detail and the results stemming from the sensitivity analysis are discussed. (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2024/1/01