Validity Arguments Meet Artificial Intelligence in Innovative Educational Assessment

Autor/inn/en	Dorsey, David W.; Michaels, Hillary R.
Titel	Validity Arguments Meet Artificial Intelligence in Innovative Educational Assessment
Quelle	In: Journal of Educational Measurement, 59 (2022) 3, S.267-271 (5 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0022-0655
DOI	10.1111/jedm.12331
Schlagwörter	Validity; Ethics; Artificial Intelligence; Evaluation Methods; Educational Assessment; High Stakes Tests; Computer Assisted Testing; Evidence Based Practice; Scoring; Innovation + Suchen Sie Ihr Suchwort? Gültigkeit; Ethik; Künstliche Intelligenz; Education; assessment; Bewertungssystem; Bewertung
Abstract	We have dramatically advanced our ability to create rich, complex, and effective assessments across a range of uses through technology advancement. Artificial Intelligence (AI) enabled assessments represent one such area of advancement--one that has captured our collective interest and imagination. Scientists and practitioners within the domains of organizational and workforce assessment have increasingly used AI in assessment, and its use is now becoming more common in education. While these types of solutions offer their users the promise of efficiency, effectiveness, and a "wow factor," users need to maintain high standards for validity and fairness in high stakes settings. Due to the complexity of some AI methods and tools, this requirement for adherence to standards may challenge our traditional approaches to building validity and fairness arguments. In this edition, we review what these challenges may look like as validity arguments meet AI in educational assessment domains. We specifically explore how AI impacts Evidence-Centered Design (ECD) and development from assessment concept and coding to scoring and reporting. We also present information on ways to ensure that bias is not built into these systems. Lastly, we discuss future horizons, many that are almost here, for maximizing what AI offers while minimizing negative effects on test takers and programs. (As Provided).
Anmerkungen	Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us
Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2024/1/01