Literaturnachweis - Detailanzeige
Autor/inn/en | Boorse, Jaclin; Van Norman, Ethan R. |
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Titel | Modeling Within-Year Growth on the Mathematics Measure of Academic Progress |
Quelle | In: Psychology in the Schools, 58 (2021) 11, S.2255-2268 (14 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
Zusatzinformation | ORCID (Boorse, Jaclin) ORCID (Van Norman, Ethan R.) |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0033-3085 |
DOI | 10.1002/pits.22590 |
Schlagwörter | Achievement Tests; Mathematics Tests; Adaptive Testing; Computer Assisted Testing; Growth Models; Middle School Students; Grade 6; Grade 7; Grade 8; Measures of Academic Progress Achievement test; Achievement; Testing; Test; Tests; Leistungsbeurteilung; Leistungsüberprüfung; Leistung; Testdurchführung; Testen; Middle school; Middle schools; Student; Students; Mittelschule; Mittelstufenschule; Schüler; Schülerin; School year 06; 6. Schuljahr; Schuljahr 06; School year 07; 7. Schuljahr; Schuljahr 07; School year 08; 8. Schuljahr; Schuljahr 08 |
Abstract | Prior research on the Measures of Academic Progress (MAP), a computer-adaptive test distributed by the Northwest Evaluation Association, has primarily focused on the Reading MAP for screening/benchmarking in elementary grades. The purpose of this study was to explore the functional form of growth and the extent to which student variability in growth was captured by the Mathematics MAP across a single school year using linear mixed-effects regression. Participants were 1608 middle school students from a school district in the Upper Midwest. Results supported a statistically significant nonlinear growth term for sixth grade and statistically significant, but small, monthly linear growth terms for sixth, seventh, and eighth grades. The Math MAP moderately captured individual variability across grades. Implications for research and practice are discussed. (As Provided). |
Anmerkungen | Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2024/1/01 |