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| Autor/inn/en | Anderson, Paul S.; Saliba, Alcyone |
|---|---|
| Titel | Changing World Patterns of Machine-Scored Objective Testing: The Expected Impact of the Multi-Digit Method. |
| Quelle | (1987), (7 Seiten)
PDF als Volltext kostenfreie Datei |
| Sprache | englisch |
| Dokumenttyp | gedruckt; online; Monographie |
| Schlagwörter | Computer Assisted Testing; Developed Nations; Developing Nations; Educational Technology; Educational Trends; Foreign Countries; Higher Education; International Studies; Objective Tests; Test Format; Test Scoring Machines; Testing Problems; Trend Analysis |
| Abstract | The use of optical scanners and computers in educational testing is common where objective testing methods (such as true-false, matching, and multiple-choice items) are well-established means of evaluating educational achievement. Where non-objective testing methods (such as fill-in-the-blank, short-answer, and essay items) have been more common, however, the diffusion of automated test scoring processes may be slow. A classification model of world patterns of educational testing methods at the university level is outlined. The three patterns are characterized as: (1) maximum current usage of machine scoring, as found in introductory courses with large numbers of students; (2) little use of machine scoring in spite of the financial resources to do so; and (3) very little use of machine scoring and few financial resources to support it. The first pattern mainly signifies universities in the United States; the second model refers to universities found throughout Europe and some American schools; and the third pattern refers mainly to developing countries in Latin America, Africa, and Asia. The ways in which these patterns are expected to change in response to contemporary demographic, economic, and technological factors are discussed. One technological factor is the recent development of the Multi-Digit Testing technique, which generates computer-scorable test items equivalent to fill-in-the-blank items, thus combining the academic rigor of free recall items with up-to-date educational testing technology. (Author/SLD) |
| Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
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