Literaturnachweis - Detailanzeige
| Autor/inn/en | Switzer, Deborah M.; Connell, Michael L. |
|---|---|
| Titel | Practical Applications of Student Response Analysis. |
| Quelle | (1989), (27 Seiten)
PDF als Volltext kostenfreie Datei |
| Sprache | englisch |
| Dokumenttyp | gedruckt; online; Monographie |
| Schlagwörter | Academic Achievement; Computer Assisted Testing; Computer Managed Instruction; Computer Software; Difficulty Level; Elementary School Students; Elementary Secondary Education; Item Analysis; Microcomputers; Scores; Secondary School Students; Statistical Distributions; Test Interpretation; Test Items; Test Results |
| Abstract | This paper describes teacher usage of the microcomputer programs Test Analysis Package (TAP) and Student Problem Package (SPP) to analyze students' test item responses. These methods of organizing, analyzing, and reporting test results have proven useful to classroom teachers. The TAP consists of four integrated microcomputer programs to edit, score, summarize, and analyze student test data at either the item or objective level. The SPP is a program for analyzing student responses on tests based on the Student-Problem Curve Theory developed by T. Sato. Standard reports include student summaries, item summaries, and test summaries. Information available for item analysis includes item ranking in order of difficulty, frequency distributions by quintiles, point-biserial correlations between response options and total test score, and modified caution indices for items (a measure of the irregularity of the responses to the items). The reports also include information useful for analysis of student achievement, including individual student percent correct data, student ranking within the classroom, and objective mastery data. Much of this information is organized into a Student-Problem Chart--a useful, easy to use summary chart of student responses. Illustrations and examples of these reports and their use by classroom teachers are appended. (TJH) |
| Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
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