The Role of Conflicting Representations and Uncertainty in Internal Error Detection during L2 Learning

Autor/inn/en	Bultena, Sybrine; Danielmeier, Claudia; Bekkering, Harold; Lemhöfer, Kristin
Titel	The Role of Conflicting Representations and Uncertainty in Internal Error Detection during L2 Learning
Quelle	In: Language Learning, 70 (2020), S.75-103 (29 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Zusatzinformation	ORCID (Bultena, Sybrine) ORCID (Lemhöfer, Kristin)
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0023-8333
DOI	10.1111/lang.12401
Schlagwörter	Second Language Learning; Learning Processes; Indo European Languages; Foreign Countries; Feedback (Response); Accuracy; Error Patterns; Syntax; Germany + Suchen Sie Ihr Suchwort? Zweitsprachenerwerb; Learning process; Lernprozess; Indoeuropäisch; Ausland; Fehlertyp; Deutschland
Abstract	Internal error monitoring as reflected by the error-related negativity (ERN) component can give insight into the process of learning a second language (L2). Yet, early stages of learning are characterized by high levels of uncertainty, which obscures the process of error detection. We examine how uncertainty about L2 syntactic representations, induced by different levels of language conflict, is reflected in ERN patterns during learning. German learners of Dutch performed a feedback-guided gender decision task in their L2 and provided subjective certainty ratings for their responses. Initially, high-conflict items yielded more uncertainty and ERN modulations were reversed (i.e., correct responses elicited larger amplitudes than errors). Two rounds of feedback resulted in an increase of accuracy, reduced uncertainty, and normalization of the ERN effect, signaling effective error monitoring. These outcomes demonstrate how subjective intuitions about response accuracy affect performance monitoring during L2 learning. (As Provided).
Anmerkungen	Wiley-Blackwell. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8598; Fax: 781-388-8232; e-mail: cs-journals@wiley.com; Web site: http://www.wiley.com/WileyCDA
Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2024/1/01