Literaturnachweis - Detailanzeige
Autor/in | Williams, Hollis |
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Titel | Influence of Curved Surface Roughness on White Light Interferometer Microscopy |
Quelle | In: Physics Education, 57 (2022) 1, Artikel 015001 (7 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
Zusatzinformation | ORCID (Williams, Hollis) |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0031-9120 |
Schlagwörter | Physics; Science Instruction; Light; Laboratory Equipment; Science Laboratories; Optics; Scientific Concepts; Concept Formation; Measurement; Secondary School Science |
Abstract | We outline the basic theory behind white light interferometry and the workings of a typical light interferometer microscope. We study WLI images obtained for rough and smooth chrome steel spheres to illustrate the principle that curved rough surfaces can be imaged with such a device as long as the surface roughness is kept within certain limits. (As Provided). |
Anmerkungen | IOP Publishing. 190 North Independence Mall West Suite 601, Philadelphia, PA 19106. Tel: 215-627-0880; Fax: 215-627-0879; e-mail: ped@ioppublishing.org; Web site: https://iopscience.iop.org/journal/0031-9120 |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2024/1/01 |