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Autor/inTormakangas, Kari
TitelAdvantages of the Rasch Measurement Model in Analysing Educational Tests: An Applicator's Reflection
QuelleIn: Educational Research and Evaluation, 17 (2011) 5, S.307-320 (14 Seiten)Infoseite zur Zeitschrift
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Spracheenglisch
Dokumenttypgedruckt; online; Zeitschriftenaufsatz
ISSN1380-3611
DOI10.1080/13803611.2011.630562
SchlagwörterTest Items; Item Analysis; Learning Processes; Item Response Theory; Teaching Methods; Educational Testing; Reflection; Measurement Objectives; Measurement Techniques; Test Interpretation; Citizenship Education; Models; Educational Principles; Goodness of Fit; Test Reliability; Test Validity; Scoring Rubrics; Evaluation Research
AbstractEducational achievement is a very important issue for parents, teachers, and the government. An accurate measurement plays a very important role in evaluating achievement fairly, and, therefore, analysis methods have been developed considerably in recent years. Education based on long-time learning processes forms a fruitful base for item tests, as it opens up possibilities to design a nearly unlimited number of items. There are several methods available to analyse such tests, but which method is the most useful and in which situation? The Rasch measurement from the Institute for Object Measurement (IOM) has pointed out to be the most useful in evaluating individual items and their functioning in a test. While the Rasch model gives a great deal of information about each single item on a test, the classical item analysis can provide additional information about response alternatives. Multiparametric item response theory (IRT) models can also provide some additional information about items, but those models require careful interpretation of results. (Contains 1 note and 11 figures.) (As Provided).
AnmerkungenRoutledge. Available from: Taylor & Francis, Ltd. 325 Chestnut Street Suite 800, Philadelphia, PA 19106. Tel: 800-354-1420; Fax: 215-625-2940; Web site: http://www.tandf.co.uk/journals
Erfasst vonERIC (Education Resources Information Center), Washington, DC
Update2017/4/10
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