Literaturnachweis - Detailanzeige
Autor/inn/en | Watts, Ashley L.; Makol, Bridget A.; Palumbo, Isabella M.; De Los Reyes, Andres; Olino, Thomas M.; Latzman, Robert D.; DeYoung, Colin G.; Wood, Phillip K.; Sher, Kenneth J. |
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Titel | How Robust Is the "P"-Factor? Using Multitrait-Multimethod Modeling to Inform the Meaning of General Factors of Psychopathology in Youth |
Quelle | (2022), (44 Seiten)
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Zusatzinformation | ORCID (Watts, Ashley L.) ORCID (Olino, Thomas M.) ORCID (Latzman, Robert D.) Weitere Informationen |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Monographie |
Schlagwörter | Multitrait Multimethod Techniques; Robustness (Statistics); Psychopathology; Youth; Statistical Bias; Data Interpretation; Correlation; Symptoms (Individual Disorders); Disclosure |
Abstract | We used multitrait-multimethod (MTMM) modeling to examine general factors of psychopathology in three samples of youth (Ns = 2119, 303, 592) for whom three informants reported on the youth's psychopathology (e.g., child, parent, teacher). Empirical support for the "p"-factor diminished in multi-informant models compared with mono-informant models: the correlation between externalizing and internalizing factors decreased and the general factor in bifactor models essentially reflected externalizing. Widely used MTMM-informed approaches for modeling multi-informant data cannot distinguish between competing interpretations of the patterns of effects we observed, including that the "p"-factor reflects, in part, evaluative consistency bias or that psychopathology manifests differently across contexts (e.g., home vs. school). Ultimately, support for the p-factor may be stronger in mono-informant designs, although it is does not entirely vanish in multi-informant models. Instead, the general factor of psychopathology in any given mono-informant model likely reflects a complex mix of variances, some substantive and some methodological. [This paper was published in "Clinical Psychological Science" v10 n4 p640-661 2022.] (As Provided). |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2024/1/01 |