Literaturnachweis - Detailanzeige
| Autor/inn/en | Wang, Changjiang; Gierl, Mark J. |
|---|---|
| Titel | Using the Attribute Hierarchy Method to Make Diagnostic Inferences about Examinees' Cognitive Skills in Critical Reading |
| Quelle | In: Journal of Educational Measurement, 48 (2011) 2, S.165-187 (23 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
| Sprache | englisch |
| Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
| ISSN | 0022-0655 |
| DOI | 10.1111/j.1745-3984.2011.00142.x |
| Schlagwörter | Reading Comprehension; Test Items; Critical Reading; Protocol Analysis; Probability; Inferences; Thinking Skills; Cognitive Ability; Models; Cognitive Measurement; Diagnostic Tests; Psychometrics; College Entrance Examinations; SAT (College Admission Test) |
| Abstract | The purpose of this study is to apply the attribute hierarchy method (AHM) to a subset of SAT critical reading items and illustrate how the method can be used to promote cognitive diagnostic inferences. The AHM is a psychometric procedure for classifying examinees' test item responses into a set of attribute mastery patterns associated with different components from a cognitive model. The study was conducted in two steps. In step 1, three cognitive models were developed by reviewing selected literature in reading comprehension as well as research related to SAT Critical Reading. Then, the cognitive models were validated by having a sample of students think aloud as they solved each item. In step 2, psychometric analyses were conducted on the SAT critical reading cognitive models by evaluating the model-data fit between the expected and observed response patterns produced from two random samples of 2,000 examinees who wrote the items. The model that provided best data-model fit was then used to calculate attribute probabilities for 15 examinees to illustrate our diagnostic testing procedure. (As Provided). |
| Anmerkungen | Wiley-Blackwell. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8598; Fax: 781-388-8232; e-mail: cs-journals@wiley.com; Web site: http://www.wiley.com/WileyCDA/ |
| Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
| Update | 2017/4/10 |
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